Rotatable broadband retarders for far-infrared spectroscopic ellipsometry
نویسندگان
چکیده
منابع مشابه
Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability.
We developed far-IR spectroscopic ellipsometer at the U4IR beamline of the National Synchrotron Light Source in Brookhaven National Laboratory. This ellipsometer is able to measure both, rotating analyzer and full-Mueller matrix spectra using rotating retarders, and wire-grid linear polarizers. We utilize exceptional brightness of synchrotron radiation in the broad spectral range between about ...
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